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  1. TitleConfidence Interval for the Distance of two Micro/Nano Structures and Its Applications in Dimensional Metrology
    Author infoGejza Wimmer ... [et al.]
    Author Wimmer Gejza 1949- (25%) UMBFP10 - Katedra matematiky
    Co-authors Karovič Karol (25%)
    Witkovský Viktor (25%)
    Koening Reiner (25%)
    Source document Measurement 2011 : proceedings of the 8th international conference on measurement, Smolenice, April 27-30, 2011. S. 80-83. - Bratislava : Slovak Academy of Sciences, 2011 ; Measurement 2011 8th international conference on measurment
    NoteBibl.: s. 83
    Keywords dĺžkový komparátor   konfidenčné intervaly   length comparators   dimensional metrology   confidence intervals  
    LanguageEnglish
    CountrySlovak Republic
    systematics 51
    AnnotationNavrhnutá je metóda určenia konfidenčných intervalov pre vzdialenosť dvoch mikro/nano štruktúr. Proposed is a method for determining the confidence interval for the distance of two micro/nano structures
    Public work category AFD
    No. of Archival Copy20536
    Catal.org.BB301 - Univerzitná knižnica Univerzity Mateja Bela v Banskej Bystrici
    Databasexpca - PUBLIKAČNÁ ČINNOSŤ
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  2. TitleMeasurement 2011
    Subtitleproceedings of the 8th international conference on measurement, Smolenice, April 27-30, 2011
    Corporation Measurement 2011 . 8th international conference on measurment , Smolenice , 27.-30.04.2011
    Issue dataBratislava : Slovak Academy of Sciences , 2011
    ISBN978-80-969-672-4-7
    LanguageEnglish
    CountrySlovak Republic
    Public work category FAI
    Catal.org.BB301 - Univerzitná knižnica Univerzity Mateja Bela v Banskej Bystrici
    Databasexpca - PUBLIKAČNÁ ČINNOSŤ
    References (1) - PUBLIKAČNÁ ČINNOSŤ


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