Number of the records: 1

Thin film analysis by x-ray scattering

Title	Thin film analysis by x-ray scattering
Author	Birkholz Mario
Issue data	Weinheim : WILEY-VCH Verlag , 2006. - 522 s.
Language	eng - English
Country	DE - Germany
ISBN	3-527-31052-5
Copy count	1, currently available 0, at library only 1
Document kind	monografie

book

Call number	Location	Sublocation	Info
10213	Elektrotechnický ústav SAV	dobr	In-Library Use Only

Number of the records: 1