Number of the records: 1
Defect Oriented TPG for Combined IDDQ-Voltage Testing of Combinational Circuits.
Title Defect Oriented TPG for Combined IDDQ-Voltage Testing of Combinational Circuits. Author Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV SCOPUS RID Co-authors Bečková Jana 1966- SAVINFO - Ústav informatiky SAV SCOPUS Another authors Gašpar Ján (Author) SAVINFO - Ústav informatiky SAV Source document EDCC3 Conference : Proc. of Fast Abstracts. - Praha, Czech Republic, 1999 Language eng - English Country CZ - Czech Republic Document kind rozpis článkov z periodík (rzb) Category AFC - Published papers from foreign scientific conferences Year 1999 article
rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 0
Number of the records: 1