Defect Oriented TPG for Combined IDDQ-Voltage Testing of Combinational Circuits.

Number of the records: 1

Title	Defect Oriented TPG for Combined IDDQ-Voltage Testing of Combinational Circuits.
Author	Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV ^SCOPUS ^RID
Co-authors	Bečková Jana 1966- SAVINFO - Ústav informatiky SAV ^SCOPUS

Another authors	Gašpar Ján (Author) SAVINFO - Ústav informatiky SAV
Source document	EDCC3 Conference : Proc. of Fast Abstracts. - Praha, Czech Republic, 1999
Language	eng - English
Country	CZ - Czech Republic
Document kind	rozpis článkov z periodík (rzb)
Category	AFC - Published papers from foreign scientific conferences
Year	1999

article

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
0

Number of the records: 1