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Defect oriented fault coverage of 100% stuck-at fault test set
Title Defect oriented fault coverage of 100% stuck-at fault test set Author Blyzniuk M. Co-authors Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV SCOPUS RID Kuzmicz W. Lobur M. Pleskacz W. Raik J. Ubar R. Source document Mixed design of integrated circuits and systems. P. 511-516 Language eng - English Country PL - Poland Document kind rozpis článkov z periodík (rzb) Category AFC - Published papers from foreign scientific conferences Year 2000 article
rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 0
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