Defect oriented fault coverage of 100% stuck-at fault test set

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Title	Defect oriented fault coverage of 100% stuck-at fault test set
Author	Blyzniuk M.
Co-authors	Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV
	Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV ^SCOPUS ^RID
	Kuzmicz W.
	Lobur M.
	Pleskacz W.
	Raik J.
	Ubar R.

Source document	Mixed design of integrated circuits and systems. P. 511-516
Language	eng - English
Country	PL - Poland
Document kind	rozpis článkov z periodík (rzb)
Category	AFC - Published papers from foreign scientific conferences
Year	2000

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Number of the records: 1