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ATPG for IDDQ and/or Voltage Testing of Combinational Circuits Using an Arbitrary Fault Library for Basic Gates

  1. TitleATPG for IDDQ and/or Voltage Testing of Combinational Circuits Using an Arbitrary Fault Library for Basic Gates
    Author Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV    SCOPUS    RID
    Co-authors Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV

    Gašpar Ján

    Mikloš P.

    Issue dataCalifornia, Los Alamitos : IEEE , 2000
    Source document ETW 2000 - Informal Digest . P. 317-318
    Languageeng - English
    CountryPT - Portugal
    Document kindrozpis článkov z periodík (rzb)
    CategoryAFC - Published papers from foreign scientific conferences
    Year2000
    article

    article

    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    2000
Number of the records: 1  

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