Physical and structural characterization of NiO thin films for gas detection

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Title	Physical and structural characterization of NiO thin films for gas detection
Author	Hotový I.
Co-authors	Huran Jozef 1955 SAVELEK - Elektrotechnický ústav SAV ^ORCID
	Spiess L.
	Siciliano P.
	Rella R.
	Řeháček V.

Source document	/ Osvald Jozef 1953 ; Haščík Štefan 1956 ; Kuzmík Ján 1960 ; Breza J. . P. 331-334 ASDAM 2000 : 3rd International EuroConference on Advanced Semiconductor Devices and Microsystems. - Piscataway : IEEE, 2000
Language	eng - English
Country	US - United States of America
Document kind	rozpis článkov z periodík (rzb)
Category	AEC - Scientific papers in foreign peer-reviewed proceedings, monographs
Category of document (from 2022)	V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka
Type of document	príspevok
Year	2000

article

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2000

Number of the records: 1