Hierarchical defect-oriented fault simulation for digital circuits

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Title	Hierarchical defect-oriented fault simulation for digital circuits
Author	Blyzniuk M.
Co-authors	Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV
	Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV ^SCOPUS ^RID
	Kuzmicz W.
	Lobur M.
	Pleskacz W.
	Raik J.
	Ubar R.

Source document	IEEE European Test Workshop. Order No. PROO390 (2000), p. 69-74. - Los Alamitos, California : IEEE Computer Society
Language	eng - English
Country	US - United States of America
Document kind	rozpis článkov z periodík (rzb)
Citations	AHMAD, A. - AL-ABRI, D. Design of a dynamic test tool in the area of digital system testing. In International Conference on Communication, Computer and Power - icccp´09. ISSN 1813-419X. 2009, p. 9-12.
Category	ADC
Year	2000
Registered in	WOS

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rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2000

Number of the records: 1