Number of the records: 1  

Time evolution of point contact resistance of high Tc superconductors

  1. TitleTime evolution of point contact resistance of high Tc superconductors
    Author Grajcar M.
    Co-authors Pleceník Andrej SAVELEK - Elektrotechnický ústav SAV

    Beňačka Štefan 1933 SAVELEK - Elektrotechnický ústav SAV

    Revenko J.

    Svistunov V.M.

    Source documentPhysica C. Vol. 218, (1993), p. 82
    Languageeng - English
    CountryCH - Switzerland
    Document kindrozpis článkov z periodík (rbx)
    Keywordssupravodiče vysokoteplotné * elektrotechnika slaboprúdová
    CitationsTRUCCATO, M. - CAGLIERO, S. - AGOSTINO, A. - PANETTA, M. - RINAUDO, G. In SUPERCONDUCTOR SCIENCE & TECHNOLOGY. ISSN 0953-2048, OCT 2006, vol. 19, no. 10, p. 1003-1009.
    CONDER, K. In MATERIALS SCIENCE & ENGINEERING R-REPORTS. ISSN 0927-796X, FEB 15 2001, vol. 32, no. 2-3, p. 41-102.
    CHANDRASEKHAR, N. - VALLS, O.T. - GOLDMAN, A.M. In PHYSICAL REVIEW B. ISSN 0163-1829, OCT 1 1996, vol. 54, no. 14, p. 10218-10220.
    NEVOLIN, V.S. - SKRYSHEVSKY, V.A. - STRIKHA, V.I. - KUS, P. - KARLOVSKY, K. I-V In CZECHOSLOVAK JOURNAL OF PHYSICS. ISSN 0011-4626, OCT 1995, vol. 45, no. 10, p. 871-877.
    PASHMAKOV, B. - ZHANG, K. - JAEGER, H.M. - TIWARI, P. - WU, X.D. In PHYSICA C. ISSN 0921-4534, JUL 15 1995, vol. 249, no. 3-4, p. 289-292.
    SUMMHAMMER, J. - KUNDZINS, K. - HOSSEINALI, G.S. - SCHALK, R.M. - WEBER, H.W. - PROYER, S. - STANGL, E. - BAUERLE, D. In PHYSICA C. ISSN 0921-4534, FEB 1 1995, vol. 242, no. 1-2, p. 127-134.
    Wei, J.-W. Chinese Physics B 18 (2009), pp. 4479-4485
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year1993
    article

    article

    rokCCIFIF Q (best)JCR Av Jour IF PercSJRSJR Q (best)CiteScore
    A
    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    1993
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.