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Defect-oriented test generation using probabilistic estimation
Title Defect-oriented test generation using probabilistic estimation Author Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Co-authors Fischerová Mária 1955- SCOPUS Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV SCOPUS RID Kuzmicz W. Pleskacz W. Raik J. Ubar R. Source document Proceedings of the 8th International Conference MIXDES 2001 : Mixed Design of Integrated Circuits and Systems. P. 131-136. - Poland : Andrzej Napieralski, 2001 Language eng - English Document kind rozpis článkov z periodík (rzb) Category AFC - Published papers from foreign scientific conferences Year 2001 article
rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2001
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