Defect-oriented test pattern generation for circuits with complex gates

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Title	Defect-oriented test pattern generation for circuits with complex gates
Author	Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV
Co-authors	Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV ^SCOPUS ^RID
	Kuzmicz W.
	Mikloš P.
	Pleskacz W.

Source document	ECS'01.Conference Proceedings : 3rd Electronic Circuits and Systems Conference. P. 3-6. - Bratislava, 2001
Language	eng - English
Country	SK - Slovak Republic
Document kind	rozpis článkov z periodík (rzb)
Category	AFD - Published papers from domestic scientific conferences
Year	2001

article

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2001

Number of the records: 1