Test pattern generation using a new VHDL open platform on behavioral level

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Title	Test pattern generation using a new VHDL open platform on behavioral level
Author	Štefanovič J.
Co-authors	Mikloš P.
	Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV ^SCOPUS ^RID
	Fischerová Mária 1955- SAVINFO - Ústav informatiky SAV ^SCOPUS

Source document	Informal Digest of IEEE European Test Workshop 2001. P. 211-213. - Stockholm, Sweden, 2001
Language	eng - English
Country	SE - Sweden
Document kind	rozpis článkov z periodík (rzb)
Citations	BENGTSSON, T. - KUMAR, S. A survey of high level test generation methodologies and fault models. In Research Report 04:5. ISSN 1404-0018, 2004, 28 p.
	BENGTSSON, T. - KUMAR, S. - PENG, Z. Application area specific system level fault models: a case study with a simple NoC switch. InThird IEEE International Workshop on Electronic Design, Test and Applications. 2006, http://um.kb.se/resolve?um=um:nbn:se:hj:diva-6455.
Category	AFC - Published papers from foreign scientific conferences
Year	2001

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rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2001

Number of the records: 1