Memory self-testing using a non-linear cellular automation in the circuit for data encryption

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Title	Memory self-testing using a non-linear cellular automation in the circuit for data encryption
Author	Baláž Marcel 1979- SAVINFO - Ústav informatiky SAV ^SCOPUS ^RID
Co-authors	Pikula Tomáš SAVINFO - Ústav informatiky SAV ^SCOPUS
	Trebatický Peter 1947- SAVINFO - Ústav informatiky SAV
	Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV ^SCOPUS ^RID

Source document	Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop. Fifth International Workshop IEEE DDECS 2002 : DDECS 2002. (2002) p. 352-355. - Brno : University of Technology, Faculty of Information Technology, 2002
Language	eng - English
Country	CZ - Czech Republic
Document kind	rozpis článkov z periodík (rzb)
Category	AFC - Published papers from foreign scientific conferences
Year	2002

article

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2002

Number of the records: 1