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Study of MIS structures with yttrium oxide films on silicon by capacitance measurements
Title Study of MIS structures with yttrium oxide films on silicon by capacitance measurements Author Harmatha L. Co-authors Novotný Řeháček V. Matay Ladislav 1950- SAVINFO - Ústav informatiky SAV SCOPUS RID Loduha M. Source document APCOM 2002. (2002), S. 78-81. - Lipt. Mikuláš : Military Academy, 2002 / Mudroň J. ; Müllerová J. ; Šutta P. ; Harmatha L. Language eng - English Country SK - Slovak Republic Document kind rozpis článkov z periodík (rzb) Category AED - Scientific papers in domestic peer-reviewed proceedings, monographs Category of document (from 2022) V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka Type of document príspevok Year 2002 
book
rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2002
Number of the records: 1