Determination of optical constants of thin films on substrates by reflectance and transmittance measurements

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Title	Determination of optical constants of thin films on substrates by reflectance and transmittance measurements
Author	1954 Ožvold Milan SAVFYZIK - Fyzikálny ústav SAV
Co-authors	1940 Mrafko Peter SAVFYZIK - Fyzikálny ústav SAV
	Gašparík V.

Source document	Proceedings of SPIE 5024 . P. 160-164. - Bellingham : SPIE, 2003 / Svechnikov S.V. ; Valakh M.Y.
Language	eng - English
Country	US - United States of America
Document kind	rozpis článkov z periodík (rzb)
Citations	LIAO, N.M. - LI, W. - JIANG, Y.D. - KUANG, Y.J. - QI, K.C. - LI, S.B. - WU, Z.M. Thickness and optical constant determination of hydrogenated amorphous silicon thin film from transmittance spectra of ellipsometer. In ACTA PHYSICA SINICA. ISSN 1000-3290, MAR 2008, vol. 57, no. 3, p. 1542-1547.
Category	AFC - Published papers from foreign scientific conferences
Year	2003

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Number of the records: 1