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A tool for teaching memory testing based on BIST
Title A tool for teaching memory testing based on BIST Author Fischerová Mária 1955- SCOPUS Co-authors Pikula Tomáš SAVINFO - Ústav informatiky SAV SCOPUS Šimlaštík Martin SAVINFO - Ústav informatiky SAV Co-authors Bosio Alberto di Carlo Stefano di Natale Giorgio Source document BEC 2006 : 2006 International Baltic Electronics Conference : proceedings of the 10th Biennial Baltic Electronics Conference. S.187-190. - : IEEE ; 10th Biennial Baltic Electronics Conference Language eng - English Country EE - Estonia Document kind rozpis článkov z periodík (rzb) Citations AWAD, A.N. - ABBU-ISSA, A.S. Low power address generator for memory built-in self test. In The Research Bulletin of Jordan ACM. 2011, vol. II (III), p. 52-56. Category AEC - Scientific papers in foreign peer-reviewed proceedings, monographs Category of document (from 2022) V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka Type of document príspevok Year 2006 Registered in WOS Registered in SCOPUS DOI 10.1109/BEC.2006.311094 
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rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 0
Number of the records: 1