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Memory test, BIST and self repair

  1. TitleMemory test, BIST and self repair
    Author Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV    SCOPUS    RID
    Co-authors Fischerová Mária 1955- SAVINFO - Ústav informatiky SAV    SCOPUS

    Source documentDesign and Test Technology for Dependable Hardware/Software Systems. (2008) CD, 84 slides. - Cottbus : BTU , 2008
    Languageeng - English
    CountryDE - Germany
    Document kindrozpis článkov z periodík (rzb)
    CategoryAFA - Published invited papers from foreign scientific conferences
    Year2008
    article

    article

    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    2008
Number of the records: 1  

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