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Application of micro-Raman spectroscopy for the evaluation of doping profile in Zn ?-doped GaAs structures

  1. TitleApplication of micro-Raman spectroscopy for the evaluation of doping profile in Zn ?-doped GaAs structures
    Author Srnánek R.
    Co-authors Irmer G.

    Donoval D.

    Osvald Jozef 1953 SAVELEK - Elektrotechnický ústav SAV    ORCID

    McPhail D.

    Christoffi A

    Sciana B

    Radziewicz D.

    Tlaczala M.

    Source document . Vol. 39, (2008), p. 1439-1443 Microelectronics Journal
    Languageeng - English
    Document kindrozpis článkov z periodík (rbx)
    CitationsSANSON, A. - NAPOLITANI, E. - CARNERA, A. - IMPELLIZZERI, G. - GIAROLA, M. - MARIOTTO, G. In JOURNAL OF RAMAN SPECTROSCOPY. FEB 2014, vol. 45, no. 2, p. 197-201.
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2008
    article

    article

    rokCCIFIF Q (best)JCR Av Jour IF PercSJRSJR Q (best)CiteScore
    A
    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    200820070.609Q3
Number of the records: 1  

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