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Chemically amplified deep UV resist for micromachining using electron beam lithography and dry etching

  1. TitleChemically amplified deep UV resist for micromachining using electron beam lithography and dry etching
    Author Hudek Peter 1953- SAVINFO - Ústav informatiky SAV    SCOPUS    RID    ORCID
    Co-authors Rangelow I.W.

    Kostič Ivan 1955- SAVINFO - Ústav informatiky SAV    SCOPUS    RID    ORCID

    Stangl Guenther

    Grabiec P.B.

    Belov Miroslav

    Shi F.

    Co-authors Rangelow E.W.
    Source document Sensors and Materials. Vol. 10, no. 4 (1998) p. 219-227
    Languageeng - English
    Document kindrozpis článkov z periodík (rbx)
    CitationsSON, Sang Uk - CHOI, Yo Han - LEE, Seung S. An efficient cell count method using a lattice molded on indents of a culture dish. In SENSORS AND ACTUATORS A-PHYSICAL. ISSN 0924-4247, 2008, vol. 147, no. 2, pp. 665-671.
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year1998
    Registered inWOS
    Registered inSCOPUS
    article

    article

    rokCCIFIF Q (best)JCR Av Jour IF PercSJRSJR Q (best)CiteScore
    A
    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    1998
Number of the records: 1  

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