Nanoscale analysis of defects in semiconductors and dielectrics by means of charge- transient spectroscopy/microscopy

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Title	Nanoscale analysis of defects in semiconductors and dielectrics by means of charge- transient spectroscopy/microscopy
Author	Lányi Štefan 1944 SAVFYZIK - Fyzikálny ústav SAV
Co-authors	Nádaždy Vojtech 1961 SAVFYZIK - Fyzikálny ústav SAV ^SCOPUS ^ORCID

Co-authors	Hruškovic Miloslav Hribik Ján
Source document	Materials Research Society Symposium Proceedings : MRS Proceedings 1995-2008., Vol. 1025. - Warrendale : Materials Research Society, 2008
Language	eng - English
Country	US - United States of America
Document kind	rozpis článkov z periodík (rzb)
Category	AFC - Published papers from foreign scientific conferences
Year	2008

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Number of the records: 1