Investigation of deep interface traps in very-thin oxide /Si structures prepared at low temperatures using chemical solutions

Number of the records: 1

Title	Investigation of deep interface traps in very-thin oxide /Si structures prepared at low temperatures using chemical solutions
Author	Rusnák Jaroslav 1958 SAVFYZIK - Fyzikálny ústav SAV ^ORCID Pinčík Emil 1956 SAVFYZIK - Fyzikálny ústav SAV ^ORCID

Co-authors	Ružinský M. Imamura K. Matsumoto T. Štefečka M. Takahashi M. Kobayashi H.
Source document	Materials Science Forum. Vol. 609 (2009), p. 123. - Zürich : Trans. Tech. Publications
Language	eng - English
Country	CH - Switzerland
Document kind	rozpis článkov z periodík (rzb)
Category	AFC - Published papers from foreign scientific conferences
Year	2009
Registered in	WOS

article

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2009	2008			0.298	Q2

Number of the records: 1