On topographic properties of semiconductor surfaces and thin film systems

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Title	On topographic properties of semiconductor surfaces and thin film systems
Author	Jurečka S. Brunner Róbert 1954 SAVFYZIK - Fyzikálny ústav SAV
	Pinčík Emil 1956 SAVFYZIK - Fyzikálny ústav SAV ^ORCID

Co-authors	Kobayashi H. Takahashi M. Madani M.
Source document	Materials Science Forum. Vol. 609 (2009), s. 275-279. - Zürich : Trans. Tech. Publications
Language	eng - English
Country	CH - Switzerland
Document kind	rozpis článkov z periodík (rzb)
Citations	CHOVANEC, Ferdinand - JURECKOVA, Maria. Fractal properties of MV-algebra pastings. In FUZZY SETS AND SYSTEMS. ISSN 0165-0114, 2013, vol. 232, pp. 46.
Category	AFC - Published papers from foreign scientific conferences
Year	2009

article

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2009	2008			0.298	Q2

Number of the records: 1