Number of the records: 1

Design and test technology for dependable systems-on-chip

Title	Design and test technology for dependable systems-on-chip
Author	Ubar Raimund
Co-authors	Raik J.
	Vierhaus Heinrich T.

Issue data	New York : Information Science Reference , 2011. - ebook
Language	eng - English
Country	US - United States of America
Document kind	monografie
Category	AAA - Scientific monographs published abroad
References	(2) Publication Activity of SAV - Articles

book

Number of the records: 1