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Correlation between the results of charge deep-level transient spectroscopy and ESR techniques for undoped hydrogenated amorphous silicon

  1. TitleCorrelation between the results of charge deep-level transient spectroscopy and ESR techniques for undoped hydrogenated amorphous silicon
    Author Nádaždy Vojtech 1961 SAVFYZIK - Fyzikálny ústav SAV    SCOPUS    ORCID Thurzo Ilja SAVFYZIK - Fyzikálny ústav SAV

    Pinčík Emil 1956 SAVFYZIK - Fyzikálny ústav SAV    ORCID

    Co-authors Durný R. Nishida A. Shimizu J. Kumeda M. Shimizu T.
    Source document Physical Review B. Vol. 66, no. 19 (2002), 195211
    Languageeng - English
    Document kindrozpis článkov z periodík (rbx)
    CitationsJURECKA, Stanislav - MUELLEROVA, Jarmila. Study of microstructural and optical properties of a-Si:H thin films. In 17TH SLOVAK-CZECH-POLISH OPTICAL CONFERENCE ON WAVE AND QUANTUM ASPECTS OF CONTEMPORARY OPTICS, 2010, vol.7746, 774615.
    DARWICH, R. - ROCA I CABARROCAS, P. Characterization of defects in hydrogenated amorphous silicon deposited on different substrates by capacitance techniques. In Thin Solid Films, 2011, vol.519, no.16, 5473-5480.
    EMELYANOV, A. V. - KONSTANTINOVA, E. A. - FORSH, P. A. - KAZANSKII, A. G. - KHENKIN, M. V. - PETROVA, N. N. - TERUKOV, E. I. - KIRILENKO, D. A. - BERT, N. A. - KONNIKOV, S. G. - KASHKAROV, P. K. Features of the structure and defect states in hydrogenated polymorphous silicon films. In JETP LETTERS. ISSN 0021-3640, 2013, vol. 97, no. 8, pp. 466.
    POMONI, M. - KOUNAVIS, P. Determination of trapping-detrapping events, recombination processes and gap-state parameters by modulated photocurrent measurements on amorphous silicon. In PHILOSOPHICAL MAGAZINE. ISSN 1478-6435, 2014, vol. 94, no. 21, pp. 2447.
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2002
    article

    article

    rokCCIFIF Q (best)JCR Av Jour IF PercSJRSJR Q (best)CiteScore
    A
    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    200220013.070
Number of the records: 1  

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