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Identification of the crystalline-phases in thin pentacene layers by Raman spectroscopy
Title Identification of the crystalline-phases in thin pentacene layers by Raman spectroscopy Author Srnánek R. Co-authors Jakabovič J. Kováč Jaroslav Kováč Jaroslav Jr. Haško D. Šatka A. Dobročka Edmund 1955 SAVELEK - Elektrotechnický ústav SAV ORCID Donoval D. Source document Vacuum. Vol. 86, (2012), p.627-629 Language eng - English Document kind rozpis článkov z periodík (rbx) Citations HOFER, A. - BIBERGER, R. - BENSTETTER, G. - WILKE, B. - GOBEL, H. In MICROELECTRONICS RELIABILITY. SEP-NOV 2013, vol. 53, no. 9-11, SI, p. 1430-1433. TOMOVIC, A.Z. - SAVIC, J.J. - BAKIC, N.L. - BORTEL, G. - FAIGEL, G. - ZIKIC, R. - JOVANOVIC, V.P. In VACUUM. OCT 2017, vol. 144, p. 36-42. ZHAO, H.L. - CLEMMEN, S. - RAZA, A. - BAETS, R. Stimulated Raman spectroscopy of analytes evanescently probed by a silicon nitride photonic integrated waveguide. In OPTICS LETTERS. MAR 15 2018, vol. 43, no. 6, p. 1403-1406. Category ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted) Category of document (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu Type of document článok Year 2012 Registered in WOS Registered in SCOPUS Registered in CCC DOI 10.1016/j.vacuum.2011.07.012 
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rok CC IF IF Q (best) JCR Av Jour IF Perc SJR SJR Q (best) CiteScore A rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2012 2011 1.317 Q2 0.570 Q2
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