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Strong biaxial texture and polymorph nature in TiO2 thin film formed by ex-situ annealing on c-plane Al2O3 surface
Title Strong biaxial texture and polymorph nature in TiO2 thin film formed by ex-situ annealing on c-plane Al2O3 surface Author Roch T. Co-authors Dobročka Edmund 1955 SAVELEK - Elektrotechnický ústav SAV ORCID Mikula M. Pidík A. Ďurina P. Haidry A.A. Plecenik T. Truchly M. Grančič B. Pleceník A. Kúš P. Source document Journal of Crystal Growth. Vol. 338, (2012), 118-124 Language eng - English Document kind rozpis článkov z periodík (rbx) Citations TARRE, A. - MOLDRE, K. - NIILISK, A. - MANDAR, H. - AARIK, J. - ROSENTAL, A. In JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. JAN-FEB 2013, vol. 31, no. 1. MOLDRE, K. - AARIK, L. - MANDAR, H. - NIILISK, A. - RAMMULA, R. - TARRE, A. - AARIK, J. In JOURNAL OF CRYSTAL GROWTH. OCT 15 2015, vol. 428, p. 86-92. BREESON, A.C. - SANKAR, G. - GOH, G.K.L. - PALGRAVE, R.G. In PHYSICAL CHEMISTRY CHEMICAL PHYSICS. 2016, vol. 18, no. 35, p. 24722-24728. PAN, Qi - WANG, Jian - REN, Yixuan - FAN, Xudong - CHENG, Hongjuan - LIU, Xingzhao. Epitaxial Growth and Interfacial Microstructures of PbSe Thin Film on CdSe Substrate. In Zhenkong Kexue yu Jishu Xuebao/Journal of Vacuum Science and Technology. ISSN 16727126, 2019-07-01, 39, 7, pp. 562-565. MOELS, K. - AARIK, L. - MAENDAR, H. - KASIKOV, A. - JOGIAAS, T. - TARRE, A. - AARIK, J. Influence of alpha-Al2O3 Template and Process Parameters on Atomic Layer Deposition and Properties of Thin Films Containing High-Density TiO2 Phases. In COATINGS. NOV 2021, vol. 11, no. 11. EZEMAGU, I.G. - EJIMOFOR, M.I. - MENKITI, M.C. Instrumental and thermal characterization of the sludge generated after bio-coagulation treatment (GSABT) of petroleum produced water (PW). In RESULTS IN ENGINEERING. ISSN 2590-1230, MAR 2021, vol. 9. Category ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted) Category of document (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu Type of document článok Year 2012 Registered in WOS Registered in SCOPUS Registered in CCC DOI 10.1016/j.jcrysgro.2011.10.053 
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rok CC IF IF Q (best) JCR Av Jour IF Perc SJR SJR Q (best) CiteScore A rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2012 2011 1.726 Q2 0.962 Q1
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