Number of the records: 1
Interplay of the tip-sample junction stability and image contrast reversal on a Cu(111) surface revealed by the 3D force field
Title Interplay of the tip-sample junction stability and image contrast reversal on a Cu(111) surface revealed by the 3D force field Author Such B. Turanský Robert 1971 SAVFYZIK - Fyzikálny ústav SAV Brndiar Ján 1980 SAVFYZIK - Fyzikálny ústav SAV RID ORCID Štich Ivan 1959 SAVFYZIK - Fyzikálny ústav SAV ORCID Co-authors Glatzel T. Kawai S. Meyer E. Source document Nanotechnology. Vol. 23, no. 4 (2012), 045705 Language eng - English Document kind rozpis článkov z periodík (rbx) Citations BAYKARA, Mehmet Z. - DAGDEVIREN, Omur E. - SCHWENDEMANN, Todd C. - MOENIG, Harry - ALTMAN, Eric I. - SCHWARZ, Udo D. Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction. In BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2012, vol.3, p. 637-650. MAJZIK, Z. - TCHALALA, M. Rachid - SVEC, M. - HAPALA, P. - ENRIQUEZ, H. - KARA, A. - MAYNE, A. J. - DUJARDIN, G. - JELINEK, P. - OUGHADDOU, H. Combined AFM and STM measurements of a silicene sheet grown on the Ag(111) surface. In JOURNAL OF PHYSICS-CONDENSED MATTER. ISSN 0953-8984, 2013, vol. 25, no. 22, 225301. JARVIS, Samuel Paul - KANTOROVICH, Lev - MORIARTY, Philip. Structural development and energy dissipation in simulated silicon apices. In BEILSTEIN JOURNAL OF NANOTECHNOLOGY. ISSN 2190-4286, 2013, vol. 4, pp. 941-948. SWEETMAN, Adam - STANNARD, Andrew. Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces. In BEILSTEIN JOURNAL OF NANOTECHNOLOGY. ISSN 2190-4286, 2014, vol. 5, pp. 386-393. KUHN, Stefan - RAHE, Philipp. Discriminating short-range from van der Waals forces using total force data in noncontact atomic force microscopy. In PHYSICAL REVIEW B. ISSN 1098-0121, 2014, vol. 89, no. 23, 235417. YIN, Feng - KOSKINEN, Pekka - KULJU, Sampo - AKOLA, Jaakko - PALMER, Richard E. Real-space Wigner-Seitz Cells Imaging of Potassium on Graphite via Elastic Atomic Manipulation. In SCIENTIFIC REPORTS. ISSN 2045-2322, 2015, vol. 5, 8276. KIM, Howon - HASEGAWA, Yukio. Site-Dependent Evolution of Electrical Conductance from Tunneling to Atomic Point Contact. In PHYSICAL REVIEW LETTERS. ISSN 0031-9007, 2015, vol. 114, no. 20, 206801. BEYER, Hannes - KORY, Max J. - HOFER, Gregor - STEMMER, Andreas - SCHLUTER, A. Dieter. Exfoliation of two-dimensional polymer single crystals into thin sheets and investigations of their surface structure by high-resolution atomic force microscopy. In NANOSCALE. ISSN 2040-3364, 2017, vol. 9, no. 27, pp. 9481-9490. XIE, Fangqing - KAVALENKA, Maryna N. - ROEGER, Moritz - ALBRECHT, Daniel - HOELSCHER, Hendrik - LEUTHOLD, Jurgen - SCHIMMEL, Thomas. Copper atomic-scale transistors. In BEILSTEIN JOURNAL OF NANOTECHNOLOGY. ISSN 2190-4286, 2017, vol. 8, pp. 530-538. DAGDEVIREN, Omur E. - SCHWARZ, Udo D. Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance. In REVIEW OF SCIENTIFIC INSTRUMENTS. ISSN 0034-6748, 2019, vol. 90, no. 3, 033707. LIEBIG, A. - PERONIO, A. - MEUER, D. - WEYMOUTH, A. J. - GIESSIBL, F. J. High-precision atomic force microscopy with atomically-characterized tips. In NEW JOURNAL OF PHYSICS. ISSN 1367-2630, 2020, vol. 22, no. 6, 063040. DAGDEVIREN, Omur E. Confronting interatomic force measurements. In REVIEW OF SCIENTIFIC INSTRUMENTS. ISSN 0034-6748, 2021, vol. 92, no. 6, 063703. Dostupné na: https://doi.org/10.1063/5.0052126. Category ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted) Category of document (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu Type of document článok Year 2012 Registered in WOS Registered in SCOPUS Registered in CCC DOI 10.1088/0957-4484/23/4/045705 article
rok CC IF IF Q (best) JCR Av Jour IF Perc SJR SJR Q (best) CiteScore A rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2012 2011 3.979 Q1 1.899 Q1
Number of the records: 1