Degradation processes in surface layers of indium oxide

Number of the records: 1

Title	Degradation processes in surface layers of indium oxide
Author	Fuks D.
Co-authors	Kiv A.
	Shapiro D.V.
	Golovanov V.
	Šmatko Vasilij 1949 SAVELEK - Elektrotechnický ústav SAV
	Donchev I.

Source document	IEEE Transactions on Device and Materials Reliability. Vol. 12, (2012), p. 133-138
Language	eng - English
Document kind	rozpis článkov z periodík (rbx)
Citations	ZHANG, B. - ZHANG, N.N. - CHEN, J.F. - HOU, Y. - YANG, S. - GUO, J.W. - YANG, X.H. - ZHONG, J.H. - WANG, H.F. - HU, P. - ZHAO, H.J. - YANG, H.G. In SCIENTIFIC REPORTS. OCT 31 2013, vol. 3.
Category	ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
Category of document (from 2022)	V3 - Vedecký výstup publikačnej činnosti z časopisu
Type of document	článok
Year	2012
Registered in	WOS
Registered in	SCOPUS
Registered in	CCC
DOI	10.1109/TDMR.2011.2178244

article

rok	CC	IF	IF Q (best)	JCR Av Jour IF Perc	SJR	SJR Q (best)	CiteScore
	A

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2012	2011	1.543	Q2	1.007	Q1

Number of the records: 1