Analysis of detection properties of particle detectors based on 4H-SiC high quality epitaxial layer

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Title	Analysis of detection properties of particle detectors based on 4H-SiC high quality epitaxial layer
Author	Zaťko Bohumír 1973 SAVELEK - Elektrotechnický ústav SAV ^ORCID
Co-authors	Dubecký František 1946 SAVELEK - Elektrotechnický ústav SAV
	Sedlačková K.
	Šagátová A.
	Boháček Pavol 1954 SAVELEK - Elektrotechnický ústav SAV
	Sekáčová Mária 1955 SAVELEK - Elektrotechnický ústav SAV
	Nečas V.

Source document	ASDAM 2014 : The 10th International Conference on Advanced Semiconductor Devices and Microsystems. P. 65-68. - : IEEE, 2014 / Breza Juraj ; Donoval Daniel ; Vavrinský E.
Language	slo - Slovak
Document kind	rozpis článkov z periodík (rzb)
Category	AFC - Published papers from foreign scientific conferences
Year	2014

article

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2014

Number of the records: 1