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New RP-CVD grown ultra-high performance selectively B-doped pure-Ge 20 nm QWs on (100)Si as basis material for post-Si CMOS technology

  1. TitleNew RP-CVD grown ultra-high performance selectively B-doped pure-Ge 20 nm QWs on (100)Si as basis material for post-Si CMOS technology
    Author Mironov O.A.
    Co-authors Hassan A.H.A.

    Uhlarz M.

    Kiatgamolchai S.

    Dobbie A.

    Morris R.J.H.

    Halpin J.E.

    Rhead S.D.

    Allred P.

    Myronov M.

    Gabáni Slavomír 1974- SAVEXFYZ - Ústav experimentálnej fyziky SAV    RID    RID    ORCID

    Berkutov I.B.

    Leadley D.R.

    Source document Physica status solidi C. Current topics in solid state physics. Vol. 11, no. 1 (2014), p. 61-64
    Languageeng - English
    Document kindrozpis článkov z periodík (rbx)
    CategoryADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2014
    Registered inWOS
    Registered inSCOPUS
    DOI 10.1002/pssc.201300164
    article

    article

    rokCCIFIF Q (best)JCR Av Jour IF PercSJRSJR Q (best)CiteScore
    N
    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    201420130.439Q3
Number of the records: 1  

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