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Optical Characteristic Measuring Apparatus
Title Optical Characteristic Measuring Apparatus : Patent US 8 982 345 B2. (Assignee: National Institute of Advanced Industrial Science and Technology, Tokyo, Japan) Author Kawate E. Co-authors Hain Miroslav 1960 SAVMER - Ústav merania SAV SCOPUS RID ORCID Issue data United States Patent and Trademark Office , March 17, 2015 Language eng - English Country US - United States of America Document kind monografie Citations KAUPP, Ansgar - SPRINGMANN, Soeren – LUETJENS, Dirk. Inspection apparatus and inspection method for inspection of the surface appearance of a flat item that represents a test specimen. US Patent 10215708B2, 2019. Category AGJ - Patent applications, utility model applications, design applications, trademark applications, applications for granting supplementary protection certificate, applications for registration of topographies of semiconductor products, designations of origin applications, geographical indications of goods and products applications, breeder's certificate applications Year 2016 
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