Trap analysis in GaN-based heterostructures using current transients measurements

Number of the records: 1

Title	Trap analysis in GaN-based heterostructures using current transients measurements
Author	Florovič M.
Co-authors	Škriniarová Jaroslava
	Gregušová Dagmar 1958 SAVELEK - Elektrotechnický ústav SAV ^ORCID
	Kováč Jaroslav
	Kordoš Peter

Source document	ASDAM 2016 : the 11th International Conference on Advanced Semiconductor Devices and Microsystems. P. 185-188. - : IEEE, 2016 / Haščík Štefan 1956 ; Dzuba Jaroslav 1987 ; Vanko Gabriel 1981
Language	eng - English
Document kind	rozpis článkov z periodík (rzb)
Category	ADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus
Category of document (from 2022)	V3 - Vedecký výstup publikačnej činnosti z časopisu
Type of document	článok
Year	2016
Registered in	WOS
Registered in	SCOPUS
DOI	10.1109/ASDAM.2016.7805926

article

rok	CC	IF	IF Q (best)	JCR Av Jour IF Perc	SJR	SJR Q (best)	CiteScore
	N

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2016

Number of the records: 1