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Comparison of critical current scaling behaviors in MgB2/SiC/Si thin films
Title Comparison of critical current scaling behaviors in MgB2/SiC/Si thin films Author Nishida A. Co-authors Taka C. Chromik Štefan 1949 SAVELEK - Elektrotechnický ústav SAV ORCID Durný R. Source document Journal of Low Temperature Physics. Vol. 187, (2017), p. 565-572 Language eng - English Document kind rozpis článkov z periodík (rbx) Category ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted) Category of document (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu Type of document článok Year 2017 Registered in WOS Registered in SCOPUS Registered in CCC DOI 10.1007/s10909-017-1777-z article
rok CC IF IF Q (best) JCR Av Jour IF Perc SJR SJR Q (best) CiteScore A rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2017 2016 1.300 Q3 0.461 Q2
Number of the records: 1