Evaluation of SI GaAs detectors after radiation degradation via alpha spectrometry

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Title	Evaluation of SI GaAs detectors after radiation degradation via alpha spectrometry
Author	Šagátová A.
Co-authors	Zaťko Bohumír 1973 SAVELEK - Elektrotechnický ústav SAV ^ORCID
	Nečas V.
	Sedlačková K.
	Fulop M.

Source document	APCOM 2017 : proceedings of the 23th International Conference on Applied Physics of Condensed Matter, June 12-14, 2017, Štrbské Pleso, Slovak Republic. P. 119-122. - Bratislava : SPEKTRUM STU, 2017 / Vajda J. ; Jamnický I.
Language	eng - English
Document kind	rozpis článkov z periodík (rzb)
Category	AFD - Published papers from domestic scientific conferences
Year	2017

article

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2017

Number of the records: 1