Number of the records: 1  

The study of 4H-SiC alpha particle detectors with different Schottky contact metallization

  1. TitleThe study of 4H-SiC alpha particle detectors with different Schottky contact metallization
    Author Zaťko Bohumír 1973 SAVELEK - Elektrotechnický ústav SAV    ORCID
    Co-authors Dubecký František 1946 SAVELEK - Elektrotechnický ústav SAV

    Ryc L.

    Šagátová A.

    Sedlačková K.

    Kováčová Eva 1966 SAVELEK - Elektrotechnický ústav SAV

    Nečas V.

    Source document AIP Conference Proceedings : Applied Physics of Condensed Matter (APCOM 2018). Vol. 1996 (2018), no. 020051
    Languageeng - English
    Document kindrozpis článkov z periodík (rbx)
    CitationsLONG, Z. - NIU, M.C. - XIA, X.C. - JIANG, W. - LI, Y.J. - JING, H.T. - LIANG, H.W. - FAN, R.R. Development of the large sensitive area 4H-SiC Schottky detectors at the Back-n. In NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT. ISSN 0168-9002, NOV 2023, vol. 1056. Dostupné na: https://doi.org/10.1016/j.nima.2023.168585.
    LONG, Z. - XIA, X.C. - JIANG, W. - NIU, M.C. - YI, H. - JING, H.T. - LIANG, H.W. - FAN, R.R. A study of the signal rising edge produced by a charge sensitive preamplifier connected to a 4H-SiC detector. In NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT. ISSN 0168-9002, MAY 2023, vol. 1050. Dostupné na: https://doi.org/10.1016/j.nima.2023.168170.
    CategoryADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2018
    Registered inWOS
    Registered inSCOPUS
    DOI 10.1063/1.5048903
    article

    article

    rokCCIFIF Q (best)JCR Av Jour IF PercSJRSJR Q (best)CiteScore
    N
    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    201820170.165
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.