Non-conventional scans in high-resolution X-ray diffraction analysis of epitaxial systems

Number of the records: 1

Title	Non-conventional scans in high-resolution X-ray diffraction analysis of epitaxial systems
Author	Dobročka Edmund 1955 SAVELEK - Elektrotechnický ústav SAV ^ORCID
Co-authors	Hasenöhrl Stanislav 1956 SAVELEK - Elektrotechnický ústav SAV ^ORCID
	Chauhan Prerna SAVELEK - Elektrotechnický ústav SAV
	Kuzmík Ján 1960 SAVELEK - Elektrotechnický ústav SAV ^ORCID

Source document	Applied Surface Science. Vol. 461 (2018), p. 23-32
Language	eng - English
Document kind	rozpis článkov z periodík (rbx)
Category	ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
Category of document (from 2022)	V3 - Vedecký výstup publikačnej činnosti z časopisu
Type of document	článok
Year	2018
Registered in	WOS
Registered in	SCOPUS
Registered in	CCC
DOI	10.1016/j.apsusc.2018.07.009

article

rok	CC	IF	IF Q (best)	JCR Av Jour IF Perc	SJR	SJR Q (best)	CiteScore
	A

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2018	2017	4.439	Q1	1.093	Q1

Number of the records: 1