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Effect of temperature and carrier gas on the properties of thick InxAl1-xN layer
Title Effect of temperature and carrier gas on the properties of thick InxAl1-xN layer Author Chauhan Prerna SAVELEK - Elektrotechnický ústav SAV Co-authors Hasenöhrl Stanislav 1956 SAVELEK - Elektrotechnický ústav SAV ORCID Dobročka Edmund 1955 SAVELEK - Elektrotechnický ústav SAV ORCID Vančo L. Stoklas Roman 1981 SAVELEK - Elektrotechnický ústav SAV ORCID Kováč Jaroslav Šiffalovič Peter 1975 SAVFYZIK - Fyzikálny ústav SAV ORCID Kuzmík Ján 1960 SAVELEK - Elektrotechnický ústav SAV ORCID Source document Applied Surface Science. Vol. 470 (2019), p. 1-7 Language eng - English Document kind rozpis článkov z periodík (rbx) Citations BANGOLLA, H.K. - SIAO, M.D. - HUANG, Y.H. - CHEN, R.S. - ZUKAUSKAITE, A. - PALISAITIS, J. - PERSSON, P.O.A. - HULTMAN, L. - BIRCH, J. - HSIAO, C.L. Composition-dependent photoconductivities in indium aluminium nitride nanorods grown by magnetron sputter epitaxy. In NANOSCALE ADVANCES. ISSN 2516-0230, NOV 8 2022, vol. 4, no. 22, p. 4886-4894. Dostupné na: https://doi.org/10.1039/d2na00456a. ZHANG, Lidong - DENG, Gaoqiang - TAO, Tao - ZUO, Changcai - GUAN, Tao - NIU, Yunfei - YU, Jiaqi - WANG, Yusen - MA, Haotian - LIU, Bin - ZHANG, Baolin - ZHANG, Yuantao. Demonstration of Weak Polarization Electric Field III-N LEDs based on Polar Plane. In LASER & PHOTONICS REVIEWS, 2023, vol. 17, no. 10, pp. ISSN 1863-8880. Dostupné na: https://doi.org/10.1002/lpor.202300400. He, X., Liu, R., Xue, Y., Zuo, R.: Review of gas phase and surface reactions in AlN MOCVD In Huagong Xuebao/CIESC Journal 74(2023), pp. 2800-2813 Category ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted) Category of document (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu Type of document článok Year 2019 Registered in WOS Registered in SCOPUS Registered in CCC DOI 10.1016/j.apsusc.2018.10.231 
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File name Access Size Downloaded Type License Effect of temperature and carrier gas on the properties of thick N layer.pdf available 3.2 MB 0 Publisher's version rok CC IF IF Q (best) JCR Av Jour IF Perc SJR SJR Q (best) CiteScore A rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2019 2018 5.155 Q1 1.115 Q1
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