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TDR and TDT methods for measuring pulse characteristics of semiconductor devices
Title TDR and TDT methods for measuring pulse characteristics of semiconductor devices Author Vilhan Martin SAVMER - Ústav merania SAV Co-authors Šatka A. Priesol J. Source document Proceedings of ELITECH '19 : 21th Conference of Doctoral Students. P. non. - Bratislava, Slovak Republic : Slovak University of Technology, 2019 / Kozáková Alena ; Juhás G. ; Šály V. ; ELITECH '19 21th Conference of Doctoral Students Language eng - English Country SK - Slovak Republic Document kind rozpis článkov z periodík (rzb) Category AFD - Published papers from domestic scientific conferences Year 2019 article
rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2019
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