Scaling analyses on the critical current density in MgB2/SiC/Si thin film processed at higher temperature

Number of the records: 1

Title	Scaling analyses on the critical current density in MgB2/SiC/Si thin film processed at higher temperature
Author	Nishida A.
Co-authors	Taka C.
	Chromik Štefan 1949 SAVELEK - Elektrotechnický ústav SAV ^ORCID

Source document	IOP Conference Series: Materials Science and Engineering : ICEC-ICMC 2018. Vol. 502 (2019), no. 012184
Language	eng - English
Document kind	rozpis článkov z periodík (rbx)
Category	ADMB - Scientific papers in foreign non-impacted journals registered in Web of Sciences or Scopus
Category of document (from 2022)	V3 - Vedecký výstup publikačnej činnosti z časopisu
Type of document	článok
Year	2019
Registered in	WOS
Registered in	SCOPUS
DOI	10.1088/1757-899X/502/1/012184

article

	File name	Access	Size	Downloaded	Type	License
	Scaling analyses on the critical current density in MgB2SiCSi thin film processed at higher temperature.pdf	available	380.8 KB	1	Publisher's version

rok	CC	IF	IF Q (best)	JCR Av Jour IF Perc	SJR	SJR Q (best)	CiteScore
	N

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2019	2018			0.192

Number of the records: 1