Black silicon - correlation between microstructure and Raman scattering

Number of the records: 1

Title	Black silicon - correlation between microstructure and Raman scattering
Author	Jurečka Stanislav
Co-authors	Pinčík Emil 1956 SAVFYZIK - Fyzikálny ústav SAV ^ORCID

Co-authors	Imamura Kentaro Matsumoto Taketoshi Kobayashi Hikaru
Source document	Journal of Electrical Engineering. Vol. 70, no. 7S (2019), p. 58-64
Language	eng - English
Country	SK - Slovak Republic
Document kind	rozpis článkov z periodík (rbx)
Category	ADNA - Scientific papers in domestic impacted journals registered in Web of Sciences or Scopus
Category of document (from 2022)	V3 - Vedecký výstup publikačnej činnosti z časopisu
Type of document	článok
Year	2019
Registered in	WOS
Registered in	SCOPUS
DOI	10.2478/jee-2019-0042

article

	File name	Access	Size	Downloaded	Type	License
	Black silicon - correlation between microstructure and Raman scattering.pdf	available	1.3 MB	3	Publisher's version

rok	CC	IF	IF Q (best)	JCR Av Jour IF Perc	SJR	SJR Q (best)	CiteScore
	N

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2019	2018	0.636	Q4	0.200	Q3

Number of the records: 1