The amplitude defect of SiC detectors during the recording of accelerated Xe ions

Number of the records: 1

Title	The amplitude defect of SiC detectors during the recording of accelerated Xe ions
Author	Hrubčín Ladislav 1951 SAVELEK - Elektrotechnický ústav SAV
Co-authors	Gurov J.B.
	Zaťko Bohumír 1973 SAVELEK - Elektrotechnický ústav SAV ^ORCID
	Boháček Pavol 1954 SAVELEK - Elektrotechnický ústav SAV
	Rozov S.V.
	Rozov I.E.
	Sandukovsky V.G.
	Skuratov V.A.

Source document	Physics of atomic nuclei. Vol. 82 (2019), p. 1682-1685
Language	eng - English
Document kind	rozpis článkov z periodík (rbx)
Citations	GAO, Run-Long - LIU, Lin-Yue - RUAN, Jin-Lu - JIN, Peng - OUYANG, Xiao - ZHOU, Lei-Dang - LI, Yang - ZHANG, Si-Long - ZHAO, Kuo - OUYANG, Xiao-Ping. Systematic Analysis of Reliability of Large-Area 4H-SiC Charged Particle Detector Under Harsh He Ion Irradiation. In IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2021, vol. 68, no. 5, pp. 1169-1174. ISSN 0018-9499. Dostupné na: https://doi.org/10.1109/TNS.2021.3069568.
Category	ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
Category of document (from 2022)	V3 - Vedecký výstup publikačnej činnosti z časopisu
Type of document	článok
Year	2019
Registered in	WOS
Registered in	SCOPUS
Registered in	CCC
DOI	10.1134/S1063778819120111

article

rok	CC	IF	IF Q (best)	JCR Av Jour IF Perc	SJR	SJR Q (best)	CiteScore
	A

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2019	2018	0.458	Q4	0.277	Q3

Number of the records: 1