Surface quality characterization of thin Nb films for superconducting radiofrequency cavities

Number of the records: 1

Title	Surface quality characterization of thin Nb films for superconducting radiofrequency cavities
Author	Ries Rastislav SAVELEK - Elektrotechnický ústav SAV ^ORCID
Co-authors	Seiler Eugen 1977 SAVELEK - Elektrotechnický ústav SAV ^ORCID
	Gömöry Fedor 1952 SAVELEK - Elektrotechnický ústav SAV ^ORCID
	Medvids A.
	Onufrijevs P.
	Pira C.
	Chyhyrynets E.
	Malyshev O.B.
	Valizadeh R.

Source document	Superconductor Science and Technology. Vol. 35 (2022), no. 075010
Language	eng - English
Country	GB - Great Britian
Document kind	rozpis článkov z periodík (rbx)
Category	ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
Category of document (from 2022)	V3 - Vedecký výstup publikačnej činnosti z časopisu
Type of document	článok
Year	2022
Registered in	WOS
Registered in	SCOPUS
Registered in	CCC
DOI	10.1088/1361-6668/ac7261

article

	File name	Access	Size	Downloaded	Type	License
	Surface quality characterization of thin Nb films for.pdf	available	3 MB	3	Publisher's version

rok	CC	IF	IF Q (best)	JCR Av Jour IF Perc	SJR	SJR Q (best)	CiteScore
	A

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2022	2021	3.464	Q2	0.826	Q1

Number of the records: 1