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Few-tilt electron ptychotomography: a new method to determine the 3D structure of 2D materials with high-precision and low-dose
Title Few-tilt electron ptychotomography: a new method to determine the 3D structure of 2D materials with high-precision and low-dose Author Hofer C. Co-authors Mustonen K. Skákalová Viera SAVELEK - Elektrotechnický ústav SAV Pennycook T.J. Source document Microscopy and Microanalysis. Vol. 28, no. S1 (2022), p. 2526-2527 Language eng - English Country US - United States of America Document kind rozpis článkov z periodík (rbx) Category ADEB - Scientific papers in other foreign journals not registered in Current Contents Connect without IF (non-impacted) Category of document (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu Type of document článok z podujatia Year 2022 DOI 10.1017/S1431927622009655 article
File name Access Size Downloaded Type License Few-tilt Electron Ptychotomography.pdf Neprístupný/archív 463.1 KB 9 Publisher's version rok CC IF IF Q (best) JCR Av Jour IF Perc SJR SJR Q (best) CiteScore N rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2022 2021 4.099 Q1 0.379 Q3
Number of the records: 1