Influence of base material thickness on spectrometry of semiconductor detectors based on semi-insulating GaAs

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Title	Influence of base material thickness on spectrometry of semiconductor detectors based on semi-insulating GaAs
Author	Šagátová A.
Co-authors	Kurucová N.
	Kotorová S.
	Kováčová Eva 1966 SAVELEK - Elektrotechnický ústav SAV
	Zaťko Bohumír 1973 SAVELEK - Elektrotechnický ústav SAV ^ORCID

Source document	EPJ Web of Conferences : ANIMMA 2023. Vol. 288 (2023), no. 10013
Language	eng - English
Country	FR - France
Document kind	rozpis článkov z periodík (rbx)
Category	ADEB - Scientific papers in other foreign journals not registered in Current Contents Connect without IF (non-impacted)
Category of document (from 2022)	V3 - Vedecký výstup publikačnej činnosti z časopisu
Type of document	článok z podujatia
Year	2023
DOI	10.1051/epjconf/202328810013

article

	File name	Access	Size	Downloaded	Type	License
	Influence of base material thickness on.pdf	available	821.1 KB	0	Publisher's version

rok	CC	IF	IF Q (best)	JCR Av Jour IF Perc	SJR	SJR Q (best)	CiteScore
	N

rok vydania	rok metriky	IF	IF Q (best)	SJR	SJR Q (best)
2023

Number of the records: 1