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From anomaly detection to defect classification
Title From anomaly detection to defect classification Author Klarák Jaromír 1994- SAVINFO - Ústav informatiky SAV SCOPUS RID ORCID Co-authors Andok Robert 1973- SAVINFO - Ústav informatiky SAV SCOPUS RID ORCID Malík Peter 1980 - SAVINFO - Ústav informatiky SAV SCOPUS RID ORCID Kuric Ivan Ritomský Mário 1993- SAVINFO - Ústav informatiky SAV SCOPUS RID ORCID Klačková Ivana Tsai Hung-Yin Source document Sensors. Vol. 24, no. 2 (2024), art. no. 429 Language eng - English Document kind rozpis článkov z periodík (rbx) Citations RAČKI, D. - TOMAŽEVIČ, D. - SKOČAJ, D. Coupling of unsupervised and supervised deep learning-based approaches for surface anomaly detection. In Journal of Electronic Imaging. 2024, vol. 33, no. 3, pp. 031207-031207. doi: 10.1117/1.JEI.33.3.031207. Category ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted) Category of document (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu Type of document článok Year 2024 Registered in WOS Registered in SCOPUS Registered in CCC DOI 10.3390/s24020429 
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rok CC IF IF Q (best) JCR Av Jour IF Perc SJR SJR Q (best) CiteScore A rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2024 2023 3.4 Q2 0.786 Q1
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