Number of the records: 1  

Atomic Force Microscopy

  1. TitleAtomic Force Microscopy : understanding basic modes and advanced applications
    Author Haugstad Greg
    Issue dataHoboken : John Wiley and Sons, Inc. , 2012. - 464 s.
    Languageeng - English
    CountryUS - United States of America
    ISBN978-0-470-63882-8
    Catal.org.SAVEXFYZ
    Copy count2, currently available 0, at library only 2
    Document kindmonografie
    book

    book

    Call numberLocationSublocationInfo
    11645Ústav exper. fyziky SAVIn-Library Use Only
    11652Ústav exper. fyziky SAVIn-Library Use Only

Number of the records: 1  

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