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Impact of ZnO gate interfacial layer on piezoelectric response of AlGaN/GaN C-HEMT based ring gate capacitor

  1. TitleImpact of ZnO gate interfacial layer on piezoelectric response of AlGaN/GaN C-HEMT based ring gate capacitor
    Author Lalinský Tibor 1951 SAVELEK - Elektrotechnický ústav SAV
    Co-authors Vanko Gabriel 1981 SAVELEK - Elektrotechnický ústav SAV    ORCID

    Vallo Martin SAVELEK - Elektrotechnický ústav SAV

    Držík Milan

    Bruncko J.

    Jakovenko J.

    Kutiš V.

    Rýger Ivan 1987 SAVELEK - Elektrotechnický ústav SAV

    Haščík Štefan 1956 SAVELEK - Elektrotechnický ústav SAV

    Husák M.

    Source document Sensors and Actuators A. Vol. 172, (2011), p. 386-391
    Languageeng - English
    Document kindrozpis článkov z periodík (rbx)
    CitationsWANG, C. - ZHANG, K. - HE, Y.L. - ZHENG, X.F. - MA, X.H. - ZHANG, J.C. - HAO, Y. In CHINESE PHYSICS LETTERS. DEC 2014, vol. 31, no. 12.
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2011
    Registered inWOS
    Registered inSCOPUS
    Registered inCCC
    DOI 10.1016/j.sna.2011.09.028
    article

    article

    rokCCIFIF Q (best)JCR Av Jour IF PercSJRSJR Q (best)CiteScore
    A
    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    201120103.370Q11.434Q1
Number of the records: 1  

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