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Technology of integrated self-aligned E/D-mode n++GaN/InAlN/AlN/GaN MOS HEMTs for mixed-signal electronics

  1. TitleTechnology of integrated self-aligned E/D-mode n++GaN/InAlN/AlN/GaN MOS HEMTs for mixed-signal electronics
    Author Blaho Michal 1983 SAVELEK - Elektrotechnický ústav SAV
    Co-authors Gregušová Dagmar 1958 SAVELEK - Elektrotechnický ústav SAV    ORCID

    Haščík Štefan 1956 SAVELEK - Elektrotechnický ústav SAV

    Seifertová Alena 1958 SAVELEK - Elektrotechnický ústav SAV

    Ťapajna Milan 1977 SAVELEK - Elektrotechnický ústav SAV    ORCID

    Šoltýs Ján 1977 SAVELEK - Elektrotechnický ústav SAV    ORCID

    Šatka A.

    Nagy L.

    Chvála A.

    Marek J.

    Carlin J.-F.

    Grandjean N.

    Konstantinidis G.

    Kuzmík Ján 1960 SAVELEK - Elektrotechnický ústav SAV    ORCID

    Source document Semiconductor Science and Technology. Vol. 31 (2016), no. 065011
    Languageeng - English
    Document kindrozpis článkov z periodík (rbx)
    CitationsKUMAR, S. - ALI, M. - KUMAR, R. - MITRA, R. - KUNDU, A. - KAR, M. Impact of Source and Drain Underlap on Analog Performance of Double-Gate AlGaN/GaN MOS-HEMT. In 2020 IEEE CALCUTTA CONFERENCE (CALCON). 2020, p. 378-381.
    HOFSTETTER, D. - AKU-LEH, C. - BECK, H. - BOUR, D.P. AlGaN-Based 1.55 mu m Phototransistor as a Crucial Building Block for Optical Computers. In CRYSTALS. NOV 2021, vol. 11, no. 11.
    Lee, D., An, J.Y., Lee, C.-H., Bong, K.W., Kim, J.:Normally off WSe2Nanosheet-Based Field-Effect Transistors with Self-Aligned Contact Doping In ACS Applied Nano MaterialsVolume 5, (2022) 18462
    CategoryADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted)
    Category of document (from 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Type of documentčlánok
    Year2016
    Registered inWOS
    Registered inSCOPUS
    Registered inCCC
    DOI 10.1088/0268-1242/31/6/065011
    article

    article

    File nameAccessSizeDownloadedTypeLicense
    Technology of integrated self-aligned.pdfNeprístupný/archív1.1 MB1Publisher's version
    rokCCIFIF Q (best)JCR Av Jour IF PercSJRSJR Q (best)CiteScore
    A
    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    201620152.098Q20.844Q1
Number of the records: 1  

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