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Surface pattering of Ge-As-Se thin films by electric charge accumulation
Title Surface pattering of Ge-As-Se thin films by electric charge accumulation Author Bilanych V.S. Co-authors Komanický Vladimír Kozejová M. Feher A. Kovalčíková Alexandra 1981 SAVMATVY - Ústav materiálového výskumu SAV SCOPUS ORCID Lofaj František 1960 SAVMATVY - Ústav materiálového výskumu SAV SCOPUS ORCID Kužma V.V. Rizak V.M. Source document Thin Solid Films. Vol. 616 (2016), p. 86-94 Language eng - English Country CH - Switzerland Document kind rozpis článkov z periodík (rbx) Citations SNIKERIS, Janis - GERBREDERS, Vjaceslays - MIZERS, Valdis. Formation of micro-/nano-structures on the surface of Cr thin films by electron beam irradiation. In JOURNAL OF NON-CRYSTALLINE SOLIDS. ISSN 0022-3093, 2018, vol. 500, no., pp. 167-172. MOLNAR, S. - BOHDAN, R. - NAGY, Gy. - RAJTA, I. - ILLES, L. - CSIK, A. - KOKENYESI, S. Direct surface patterning of amorphous chalcogenide layers with high- energy H+ and He+ ion beams. In JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS. ISSN 0957-4522, 2019, vol. 30, no. 16, pp. 15331-15338. SNIKERIS, Janis - GERBREDERS, Vjaceslavs. Effects of electron beam irradiation on a Ag/AsS2 bilayer using conductive atomic force microscopy. In THIN SOLID FILMS. ISSN 0040-6090, 2021, vol. 731, no., pp. PALKA, K. - KURKA, M. - SLANG, S. - VLCEK, M. Utilization of As50Se50 thin films in electron beam lithography. In MATERIALS CHEMISTRY AND PHYSICS. ISSN 0254-0584, 2021, vol. 259, no., pp. POPOVYCH, M.V. - STRONSKI, A.V. - REVUTSKA, L.O. - SHPORTKO, K.V. - POLISHCHUK, Y. - PAIUK, O.P. - GORONESKUL, V.Y. Structural investigation of Ge-As-Se glasses. In JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS. ISSN 1454-4164, JAN-FEB 2023, vol. 25, no. 1-2, p. 49-55. Category ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted) Category of document (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu Type of document článok Year 2016 Registered in WOS Registered in SCOPUS Registered in CCC DOI 10.1016/j.tsf.2016.07.073 
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File name Access Size Downloaded Type License Surface pattering of Ge-As-Se thin films by electric charge accumulation.pdf Neprístupný/archív 2.4 MB 0 Publisher's version rok CC IF IF Q (best) JCR Av Jour IF Perc SJR SJR Q (best) CiteScore A rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2016 2015 1.761 Q2 0.680 Q1
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